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Probing and electron tunneling of quantum dot systems.

机译:量子点系统的探测和电子隧穿。

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摘要

This thesis is on the electronic transport properties of quantum dot systems. We investigate three issues in this thesis. The first one is how to probe the electronic structures of a single quantum dot. The second one is the mechanism of negative differential capacitance (NDC) of a single quantum dot due to the bias dependence of tunneling rates. The last one is the negative differential resistance (NDR) due to the resonance coupling in a parallel coupled quantum dot dimer. We propose a new method of probing the electronic structures of a single quantum dot system and new mechanisms for NDC and NDR in single and double quantum dot systems.; Our knowledge on the electronic properties of a quantum dot system is mainly obtained from two experimental methods—optical and transport measurements. Each of the two methods is suitable to measure some particular properties of quantum dot systems. By combining these two methods, that is, the photon-assisted tunneling measurement, we show that we can obtain some important quantities, which may be difficult or even impossible to obtain by using either of them. For example, we can obtain the spontaneous emission rate of an electron level of a quantum dot from the photon-assisted tunneling measurement.; We numerically study the external voltage bias dependence of charges accumulated on a quantum dot. We show that charges are sensitive to the change of the number of both filled and conducting levels (channels). Furthermore, we clarify that there are many possible outcomes of applying a bias. For example, the number of conducting channels increases, but the number of filled levels decreases. Or the number of filled levels does not change while the number of conducting channels increases with the bias. In the second case, charges are generally expected to increase monotonically with the applied bias. However, we numerically show that charges may decrease with the applied bias if the electron transmission coefficients depend on bias. We also provide a theoretical explanation of this new mechanism of the NDC.; At last, we show a new mechanism of NDR in a parallel coupled quantum-dot dimer. We investigate the electron tunneling through a coupled quantum-dot dimer under a dc-bias. We find that a peak in the I-V curve appears at low temperature when two discrete electronic states in each quantum dots are aligned, which we call the resonance coupling. This leads to a NDR. We also study the dependence of peak height and width on the interdot coupling and temperature. We expect that this new NDR may be useful to understand results of STM experiments.
机译:本文主要研究量子点系统的电子输运性质。本文研究了三个问题。第一个是如何探测单个量子点的电子结构。第二个是由于隧穿速率的偏置依赖性而导致的单个量子点的负差分电容(NDC)的机制。最后一个是由于并联耦合量子点二聚体中的共振耦合引起的负差分电阻(NDR)。我们提出了一种探测单量子点系统电子结构的新方法,以及单双量子点系统中NDC和NDR的新机制。我们对量子点系统电子特性的了解主要来自两种实验方法-光学和传输测量。两种方法中的每一种都适合于测量量子点系统的某些特定属性。通过结合这两种方法,即光子辅助隧穿测量,我们表明我们可以获得一些重要的数量,而使用它们中的任何一个都可能很难甚至无法获得。例如,我们可以从光子辅助隧穿测量中获得量子点电子能级的自发发射率。我们数值研究量子点上积累的电荷的外部电压偏置依赖性。我们表明,电荷对填充和传导能级(通道)数量的变化很敏感。此外,我们澄清说,施加偏见有许多可能的结果。例如,导电通道的数量增加,但是填充液位的数量减少。或填充水平的数量不会改变,而导电通道的数量会随着偏置而增加。在第二种情况下,通常期望电荷随着施加的偏压而单调增加。但是,我们从数字上表明,如果电子传输系数取决于偏压,则电荷可能会随着施加的偏压而减少。我们还为NDC的这一新机制提供了理论解释。最后,我们展示了在并联耦合量子点二聚体中的一种新的NDR机制。我们研究了在直流偏置下通过耦合量子点二聚体的电子隧穿。我们发现,当每个量子点中的两个离散电子状态对齐时, I-V 曲线的峰值出现在低温下,这称为共振耦合。这导致NDR。我们还研究了峰高和峰宽对点间耦合和温度的依赖性。我们希望这个新的NDR可能有助于理解STM实验的结果。

著录项

  • 作者

    Wang, Shidong.;

  • 作者单位

    Hong Kong University of Science and Technology (People's Republic of China).;

  • 授予单位 Hong Kong University of Science and Technology (People's Republic of China).;
  • 学科 Physics Condensed Matter.
  • 学位 Ph.D.
  • 年度 2003
  • 页码 p.3338
  • 总页数 142
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 O49;
  • 关键词

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