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Effects of surface modification on charge-carrier dynamics at semiconductor interfaces.

机译:表面改性对半导体界面电荷载流子动力学的影响。

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摘要

Understanding the basic concepts of semiconductor junctions is an important step towards the development of efficient solar energy conversion devices. The work described in this dissertation includes both the investigation of semiconductor/liquid junctions and the modification of semiconductor surfaces for achieving chemical control over physical properties.; The interfacial charge-carrier dynamics of n-GaAs/CH,CN junctions has been investigated. Differential capacitance barrier height measurements and steady-state current density-potential (J-E) measurements were used to evaluate the degree of partial Fermi-level pinning. The presence of irreversible chemical and/or electrochemical changes on n-GaAs electrodes immersed in CH3CN-COCA2+/0 solutions was examined using x-ray photoelectron spectroscopy (XPS) and cyclic voltammetric studies that were designed to probe surface reactions.; Chemical modifications of semiconductor surfaces can provide a reliable mean to control physical properties of semiconductor interfaces. The growth of robust polymer films that are covalently attached to Si surfaces via a Si-C linkage was demonstrated. Uniform polymer overlayers of different thicknessess were formed using a general method combining chlorination/Grignard reaction with ring-opening metathesis polymerization (ROMP). The surfaces of these modified Si were characterized by x-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM), ellipsometry, and/or profilometry. The charge-carrier dynamics at these modified Si/air interfaces was investigated using transient photoconductivity decay method. Time-dependent photoconductivity measurements further confirmed the ability for polymer-terminated Si to maintain low surface recombination velocities once exposed to the air.
机译:了解半导体结的基本概念是朝着开发高效太阳能转换器件迈出的重要一步。本文的工作包括对半导体/液体结的研究以及对半导体表面的改性,以实现对物理性质的化学控制。研究了 n -GaAs / CH,CN结的界面电荷-载流子动力学。差分电容势垒高度测量和稳态电流密度电位( J-E )测量用于评估部分费米能级钉扎的程度。浸在CH 3 CN-COCA 2 + / 0中的 n -GaAs电极上存在不可逆的化学和/或电化学变化解决方案是使用X射线光电子能谱(XPS)和旨在检测表面反应的循环伏安法研究的。半导体表面的化学修饰可以提供可靠的手段来控制半导体界面的物理特性。证实了通过Si-C键共价附于Si表面的坚固的聚合物膜的生长。使用将氯化/格氏反应与开环易位聚合(ROMP)结合的常规方法,可以形成厚度不同的均匀聚合物叠层。这些改性的Si的表面通过X射线光电子能谱(XPS),扫描电子显微镜(SEM),椭偏和/或轮廓测定来表征。使用瞬态光电导衰减方法研究了这些修饰的Si /空气界面上的载流子动力学。随时间变化的光电导率测量结果进一步证实,一旦暴露于空气,聚合物封端的硅具有保持低表面复合速度的能力。

著录项

  • 作者

    Juang, Agnes.;

  • 作者单位

    California Institute of Technology.;

  • 授予单位 California Institute of Technology.;
  • 学科 Chemistry Physical.
  • 学位 Ph.D.
  • 年度 2003
  • 页码 191 p.
  • 总页数 191
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 物理化学(理论化学)、化学物理学;
  • 关键词

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