首页> 外文学位 >Fabrication and characterization of mercurocuprate superconductors on silver substrates.
【24h】

Fabrication and characterization of mercurocuprate superconductors on silver substrates.

机译:在银基板上制备和表征巯基铜酸盐超导体。

获取原文
获取原文并翻译 | 示例

摘要

The HgBa2CaCu2O6+delta (Hg-1212) and HgBa2Ca2Cu3O8+delta (Hg-1223) superconductors posses excellent superconducting properties, especially above 77 K. To be commercially viable, however, manufacturing wire/tapes of these superconductors has to be addressed. This research studies the fabrication and characterization of doped Hg-1212 and Hg-1223 superconductors grown on silver substrates using dip-coating and pulsed laser deposition (PLD) techniques. The main goal of this thesis is to optimize the synthesis parameters, understand the growth mechanism, and investigate the influences of the silver interface on the microstructure and superconducting properties of doped Hg-1212/Hg-1223 films.; A process methodology is firstly developed to fabricate Pb and Re doped Hg-1223 thick films on silver substrates using the dip-coating method. The phase content, microstructure, irreversibility behavior, and critical current density of the dip-coated films are investigated by x-ray diffraction (XRD), scanning electron microscopic (SEM), transmission electron microscopy (TEM), Superconductor QUantum Interference Device (SQUID), magneto-optical imaging (MOI). The Re-doped films show the dominant phase of (Hg,Re)-1223, characterized by an onset critical temperature (Tc) of 131 K. The transport critical current (Ic) is measured at 4.2 K, self-field using the standard four-point probe method with a 1 muV/cm criterion. The transport critical current density, Jtranc , at 4.2 K and self-field is ∼3 x 103 A/cm 2. The limitations to the critical currents are discussed in detail.; The comparison of Pb and Re doping effects on microstructure and irreversibility are studied. The Pb-doped films have much larger colony size, compared to that of the Re-doped films, whereas the Re-doping significantly decreases the structural anisotropy gamma, which consequently increases the vortex line stiffness and enhances flux pinning.; (Hg,Re)-1212 thin films are also synthesized on silver substrates using the PLD method. The optimization studies of the synthesis parameters show that quality films are those deposited at 200 mJ for 30 min followed by an annealing of 670°C for 10 h. The as-prepared films exhibit c-axis orientation but without in-plane texture, which mainly results from the polycrystalline structure of silver. Although the average Jtranc (4.2 K, self-field) of the PLD thin films, ∼3 x 10 4 A/cm2, is about one order-of-magnitude higher than that of the dip-coated thick films, it is about two orders-of-magnitude lower than the corresponding magnetization critical current density, Jmagc . The lower Jtranc value is attributed to the poor grain connectivity and film texture, and cracks in the grains formed because of the differences in the coefficient of thermal expansion between the film and the substrate.; The laser deposited (Hg,Re)-1212 film/silver interface microstructure is studied by SEM and TEM, showing that the substrate surface morphology significantly affect the film nucleation and growth. The (Hg,Re)-1212 film growth mechanism is investigated by Atomic Force Microscopy (AFM). A two-stage growth mode is also proposed.
机译:HgBa2CaCu2O6 +δ(Hg-1212)和HgBa2Ca2Cu3O8 +δ(Hg-1223)超导体具有出色的超导性能,尤其是在77 K以上时。然而,要在商业上可行,必须解决这些超导体的制造导线/胶带问题。这项研究使用浸涂和脉冲激光沉积(PLD)技术研究了在银基板上生长的掺杂Hg-1212和Hg-1223超导体的制备和表征。本文的主要目的是优化合成参数,了解其生长机理,研究银界面对掺杂的Hg-1212 / Hg-1223薄膜的微观结构和超导性能的影响。首先开发了一种工艺方法,以浸涂法在银基底上制造Pb和Re掺杂的Hg-1223厚膜。通过X射线衍射(XRD),扫描电子显微镜(SEM),透射电子显微镜(TEM),超导量子干涉仪(SQUID)研究了浸涂膜的相含量,微观结构,不可逆行为和临界电流密度。 ),磁光成像(MOI)。重新掺杂的薄膜显示(Hg,Re)-1223的主导相,其特征在于起始临界温度(Tc)为131K。传输临界电流(Ic)在4.2 K下测量,使用标准自电场以1 muV / cm为标准的四点探针法。传输临界电流密度Jtranc在4.2 K和自电场下约为3 x 103 A / cm 2。详细讨论了临界电流的限制。研究了Pb和Re掺杂对微结构和不可逆性的影响。与重掺杂薄膜相比,掺铅薄膜具有更大的菌落尺寸,而重掺杂显着降低了结构各向异性γ,从而增加了涡旋线刚度并增强了通量钉扎。还使用PLD方法在银衬​​底上合成了(Hg,Re)-1212薄膜。合成参数的优化研究表明,优质薄膜是在200 mJ下沉积30分钟,然后在670°C退火10小时的薄膜。所制备的膜表现出c轴取向,但是没有平面纹理,这主要是由于银的多晶结构。尽管PLD薄膜的平均Jtranc(4.2 K,自电场)约为3 x 10 4 A / cm2,比浸涂厚膜的平均Jtranc高约一个数量级,但约为2倍。数量级低于相应的磁化临界电流密度Jmagc。较低的Jtranc值归因于较差的晶粒连通性和薄膜质地,以及由于薄膜与基材之间的热膨胀系数不同而导致的晶粒开裂。通过SEM和TEM研究了激光沉积的(Hg,Re)-1212薄膜/银界面的微观结构,表明基底表面形态显着影响薄膜的成核和生长。 (Hg,Re)-1212膜的生长机理由原子力显微镜(AFM)研究。还提出了两阶段的增长模式。

著录项

  • 作者

    Su, Jianhua.;

  • 作者单位

    The Florida State University.;

  • 授予单位 The Florida State University.;
  • 学科 Engineering Materials Science.; Engineering Mechanical.
  • 学位 Ph.D.
  • 年度 2004
  • 页码 169 p.
  • 总页数 169
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 工程材料学;机械、仪表工业;
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号