首页> 外文学位 >Design of a Material Test Kit for Use from 1.6 GHz to 26.5 GHz and its Use in Evaluation of Dielectric Properties of Foam Core Materials Used in Sandwich Composites.
【24h】

Design of a Material Test Kit for Use from 1.6 GHz to 26.5 GHz and its Use in Evaluation of Dielectric Properties of Foam Core Materials Used in Sandwich Composites.

机译:设计用于1.6 GHz至26.5 GHz的材料测试套件,并将其用于评估夹芯复合材料中所用泡沫芯材料的介电性能。

获取原文
获取原文并翻译 | 示例

摘要

In the present world, the usage of composite materials has been considerably increased in various fields. The composites have found a wide variety of applications in the field of electrical engineering and electronics such as insulators, electromagnetic interference (EMI) shielding materials etc. So, the research in the measurement of electromagnetic properties i.e. dielectric properties of these materials has been conducted. In this presentation, the dielectric properties of various RohacellRTM composite foams will be shown. These foams are widely used in the field of antenna design, Magnetic Resonance Imaging (MRI) and the aerospace industry. These composite materials are measured using an Agilent N5242-X vector network analyzer (VNA) in various bands such as R-band, S-band, C-band, G-band, C-band, X-band, P-band and K-band i.e. the dielectric properties of these materials are measured in the frequency range of 1.70 GHz to 26.5 GHz. The rectangular waveguide (RWG) is used for the measurement. Calibration kits have been designed for these waveguides. We have used the Agilent 85071E material measurement software to find the permittivity in terms of the measured S-parameters. A complete view about the design of calibration kits and calibration of VNA will also be discussed in this report.
机译:在当今世界,在各个领域中复合材料的使用已经大大增加。该复合材料在电气工程和电子学领域中发现了广泛的应用,例如绝缘体,电磁干扰(EMI)屏蔽材料等。因此,已经进行了电磁性能即这些材料的介电性能的测量研究。在本演示中,将显示各种RohacellRTM复合泡沫的介电性能。这些泡沫被广泛用于天线设计,磁共振成像(MRI)和航空航天领域。使用Agilent N5242-X矢量网络分析仪(VNA)在R波段,S波段,C波段,G波段,C波段,X波段,P波段和在1.70 GHz至26.5 GHz的频率范围内测量K波段,即这些材料的介电性能。测量使用矩形波导(RWG)。已为这些波导设计了校准套件。我们已使用Agilent 85071E材料测量软件来根据测量的S参数找到介电常数。本报告还将讨论有关校准套件设计和VNA校准的完整视图。

著录项

  • 作者

    Sankranthi, Naveen Kumar.;

  • 作者单位

    The University of Mississippi.;

  • 授予单位 The University of Mississippi.;
  • 学科 Engineering Electronics and Electrical.
  • 学位 M.S.
  • 年度 2012
  • 页码 221 p.
  • 总页数 221
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

  • 入库时间 2022-08-17 11:42:36

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号