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Strain-balanced Indium Arsenide-Indium Arsenic Antimonide Type-II Superlattices on Gallium Antimonide Substrates for Infrared Photodetector Applications.

机译:在红外光电探测器应用的锑化镓衬底上的应变平衡砷化铟-砷化铟铟II型超晶格。

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摘要

Infrared photodetectors, used in applications for sensing and imaging, such as military target recognition, chemical/gas detection, and night vision enhancement, are predominantly comprised of an expensive II-VI material, HgCdTe. III-V type-II superlattices (SLs) have been studied as viable alternatives for HgCdTe due to the SL advantages over HgCdTe: greater control of the alloy composition, resulting in more uniform materials and cutoff wavelengths across the wafer; stronger bonds and structural stability; less expensive substrates, i.e., GaSb; mature III-V growth and processing technologies; lower band-to-band tunneling due to larger electron effective masses; and reduced Auger recombination enabling operation at higher temperatures and longer wavelengths. However, the dark current of InAs/Ga1-xInxSb SL detectors is higher than that of HgCdTe detectors and limited by Shockley-Read-Hall (SRH) recombination rather than Auger recombination. This dissertation work focuses on InAs/InAs1-xSbx SLs, another promising alternative for infrared laser and detector applications due to possible lower SRH recombination and the absence of gallium, which simplifies the SL interfaces and growth processes.;InAs/InAs1-xSbx SLs strain-balanced to GaSb substrates were designed for the mid- and long-wavelength infrared (MWIR and LWIR) spectral ranges and were grown using MOCVD and MBE by various groups. Detailed characterization using high-resolution x-ray diffraction, atomic force microscopy, photoluminescence (PL), and photoconductance revealed the excellent structural and optical properties of the MBE materials.;Two key material parameters were studied in detail: the valence band offset (VBO) and minority carrier lifetime. The VBO between InAs and InAs 1-xSbx strained on GaSb with x = 0.28--0.41 was best described by Qv = DeltaEv/DeltaE g = 1.75 +/- 0.03. Time-resolved PL experiments on a LWIR SL revealed a lifetime of 412 ns at 77 K, one order of magnitude greater than that of InAs/Ga1-xInxSb LWIR SLs due to less SRH recombination. MWIR SLs also had 100's of ns lifetimes that were dominated by radiative recombination due to shorter periods and larger wave function overlaps. These results allow InAs/InAs1-xSbx SLs to be designed for LWIR photodetectors with minority carrier lifetimes approaching those of HgCdTe, lower dark currents, and higher operating temperatures.
机译:用于军事目标识别,化学/气体检测和夜视增强等传感和成像应用的红外光电探测器主要由昂贵的II-VI材料HgCdTe组成。由于III-V型II型超晶格(SLs)相对于HgCdTe具有SL的优势,因此已作为HgCdTe的可行替代品进行了研究:更好地控制合金成分,从而使整个晶片的材料和截止波长更加均匀;牢固的键合和结构稳定性;较便宜的衬底,即GaSb;成熟的III-V生长和加工技术;由于较大的电子有效质量,导致较低的带间隧穿;并减少了俄歇重组,从而可以在更高的温度和更长的波长下运行。但是,InAs / Ga1-xInxSb SL检测器的暗电流高于HgCdTe检测器,并且受Shockley-Read-Hall(SRH)重组而不是俄歇重组的限制。本论文的工作重点是InAs / InAs1-xSbx SLs,由于可能的SRH重组较低且不含镓,这是红外激光器和检测器应用的另一有希望的替代品,从而简化了SL界面和生长过程。针对中长波长红外(MWIR和LWIR)光谱范围设计了与GaSb平衡的衬底,并使用MOCVD和MBE分别将其生长。使用高分辨率X射线衍射,原子力显微镜,光致发光(PL)和光电导进行的详细表征揭示了MBE材料的优异结构和光学性质。;详细研究了两个关键材料参数:价带偏移(VBO) )和少数载流子寿命。用Qv = DeltaEv / DeltaE g = 1.75 +/- 0.03最好地描述了在GaSb上以x = 0.28--0.41应变的InAs和InAs 1-xSbx之间的VBO。在LWIR SL上进行时间分辨的PL实验显示,在77 K下的寿命为412 ns,比InAs / Ga1-xInxSb LWIR SL的寿命大一个数量级,这是因为SRH重组较少。 MWIR SL还具有100 ns的寿命,这些寿命由于较短的周期和更大的波函数重叠而受到辐射重组的支配。这些结果使得InAs / InAs1-xSbx SL可以设计用于LWIR光电探测器,其少数载流子寿命接近HgCdTe的寿命,更低的暗电流和更高的工作温度。

著录项

  • 作者

    Steenbergen, Elizabeth H.;

  • 作者单位

    Arizona State University.;

  • 授予单位 Arizona State University.;
  • 学科 Engineering Electronics and Electrical.;Engineering Materials Science.
  • 学位 Ph.D.
  • 年度 2012
  • 页码 201 p.
  • 总页数 201
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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