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Design and fabrication of on chip microwave pulse power detectors.

机译:片上微波脉冲功率检测器的设计与制造。

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摘要

On-chip microwave pulse-power detectors are promising devices for many electrical systems of both military and commercial applications. Most research in microwave power detector design have been focused on thermal power detectors, such as thermistors or thermocouples, due to their wide dynamic range and high frequency operation. However, due to their slow thermal response time, it is impossible to detect microwave pulses with a few micro or sub-micro seconds of pulse width. Schottky diode power detectors are the best candidates for this purpose due to their fast pulse response time and small size.; We have developed a means for fabricating Schottky diodes as part of any Complementary-Metal-Oxide-Semiconductor (CMOS) process by modifying the layout file. CMOS Schottky diodes were added at pre-selected locations through a CMOS process. We have also developed a process for adding or deleting Schottky diodes on a CMOS fabricated chip by using Focused Ion Beam (FIB). FIB milling and ion induced deposition were used for adding or deleting Schottky diodes at any desired location on a CMOS-fabricated chip as a post-CMOS process. Spice models of CMOS Schottky diodes were developed and used for designing the RF front end circuits in passive RF circuits. MOSFET based RF pulsed power detector circuits were also designed and fabricated.; Fabricated power detectors were tested under direct injection and radiation of microwave pulse signals. Measured results for fabricated CMOS Schottky diodes, FIB Schottky diodes and MOSFET half-wave and full-wave rectifier circuits are summarized in a table with the pulse response time, the dynamic range, the sensitivity, and the frequency response to determine which power detector is the best choice for detecting a specific source signal.
机译:片上微波脉冲功率检测器是用于军事和商业应用的许多电气系统的有前途的设备。微波功率检测器设计的大多数研究都集中在热功率检测器上,例如热敏电阻或热电偶,因为它们具有宽的动态范围和高频率操作。但是,由于它们的热响应时间慢,因此无法检测到脉宽只有几微秒或亚微秒的微波脉冲。肖特基二极管功率检测器由于其快速的脉冲响应时间和小尺寸而成为最佳选择。通过修改布局文件,我们已经开发出一种制造肖特基二极管的方法,作为任何互补金属氧化物半导体(CMOS)工艺的一部分。通过CMOS工艺在预定位置添加了CMOS肖特基二极管。我们还开发了一种通过使用聚焦离子束(FIB)在CMOS制造的芯片上添加或删除肖特基二极管的工艺。 FIB铣削和离子诱导沉积被用来在CMOS制后的芯片上的任何所需位置添加或删除肖特基二极管。开发了CMOS肖特基二极管的Spice模型,并将其用于设计无源RF电路中的RF前端电路。还设计和制造了基于MOSFET的RF脉冲功率检测器电路。在微波脉冲信号的直接注入和辐射下对预制的功率检测器进行了测试。在表中汇总了制造的CMOS肖特基二极管,FIB肖特基二极管以及MOSFET半波和全波整流器电路的测量结果,并附有脉冲响应时间,动态范围,灵敏度和频率响应,以确定哪个功率检测器是检测特定源信号的最佳选择。

著录项

  • 作者

    Jeon, Woochul.;

  • 作者单位

    University of Maryland, College Park.;

  • 授予单位 University of Maryland, College Park.;
  • 学科 Engineering Electronics and Electrical.
  • 学位 Ph.D.
  • 年度 2005
  • 页码 138 p.
  • 总页数 138
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 无线电电子学、电信技术;
  • 关键词

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