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Nanomaterial characterization using actuated microelectromechanical testing stages.

机译:使用致动的微机电测试台进行纳米材料表征。

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摘要

In this work, microfabricated mechanical systems have been created in a variety of forms and operated to perform nanomaterials characterization tests. A simplified integrated test system was developed and used to collect data from a range of materials including gallium nitride nanowires. A new force estimation approach was developed which enables estimation of the forces provided by electrothermal microelectromechanical (MEMS) actuators, and with knowledge of a material specimen cross-section area, an estimation of the engineering stress within the nanomaterial specimen.;In an expanded design, a MEMS micromanipulator probe interfaced with a removable specimen holder, also known as a test coupon, to apply strain to and acquire tensile data from carbon nanotubes grown directly on a test coupon. A novel approach for removably interfacing two microfabricated chips was created. This interface mechanism enables the test coupon to incorporate a selection of possible experiments. These test devices can be operated in vacuum or air environments, and serve as a proof-of-concept of a microsystem testbed for mechanical measurements that can be performed simultaneously with other types of measurements such as electron diffraction, piezoresistive measurement, scanning tunneling microscope observation, or optical measurements.;The goal of this thesis was the demonstration of a microsystem capable of performing tensile characterization of nanowire or nanotube specimens that are not permanently interfaced to the actuators used to apply mechanical strain, with emphasis on the overall operation and characterization of this system.
机译:在这项工作中,以各种形式创建了微细机械系统,并进行了纳米材料表征测试。开发了一种简化的集成测试系统,该系统用于收集包括氮化镓纳米线在内的多种材料的数据。开发了一种新的力估计方法,该方法可以估计由电热微机电(MEMS)致动器提供的力,并且在了解材料样本横截面积的情况下,可以估计纳米材料样本内的工程应力。 MEMS微操纵器探头与可移动的样品架(也称为测试样板)相接,以向直接在测试样板上生长的碳纳米管施加应变并从中获取拉伸数据。创建了一种可拆卸地连接两个微型芯片的新颖方法。这种接口机制使测试样板可以结合可能的实验选择。这些测试设备可以在真空或空气环境中运行,并作为用于机械测量的微系统测试台的概念验证,可以与其他类型的测量(例如电子衍射,压阻测量,扫描隧道显微镜观察)同时进行本论文的目的是演示一种能够对纳米线或纳米管样品进行拉伸表征的微系统,该样品不会永久性地与用于施加机械应变的致动器相接,重点在于整体操作和表征。这个系统。

著录项

  • 作者

    Brown, Joseph James.;

  • 作者单位

    University of Colorado at Boulder.;

  • 授予单位 University of Colorado at Boulder.;
  • 学科 Engineering Mechanical.;Nanotechnology.
  • 学位 Ph.D.
  • 年度 2010
  • 页码 282 p.
  • 总页数 282
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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