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Metalorganic chemical vapor deposition of indium nitride and indium gallium nitride thin films and nanostructures for electronic and photovoltaic applications.

机译:用于电子和光伏应用的氮化铟和氮化铟镓薄膜以及纳米结构的金属有机化学气相沉积。

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Single and multi-junction InxGa1-xN solar cell devices were modeled in one dimension using MEDICI device simulation software to assess the potential of InxGa1-xN-based solar cells. Cell efficiencies of 16 and 27.4%, under AM0 illumination were predicted for a single and a 5-junction InxGa1-xN solar cell, respectively. Phase separation of InxGa1-xN alloys is determined to have little to no negative effects on the solar cell efficiency.; InxGa1-xN alloys were grown by MOCVD over the entire compositional range (0 ≤ x ≤ 1) and phase separation was analyzed with respect to substrate material and growth temperature. A low deposition temperature of 530°C was used to produce metastable InxGa1-xN/c-Al 2O3 thin films over the entire compositional range, which was demonstrated for the first time by MOCVD. The use of higher deposition temperature and closely lattice matched substrates resulted in phase separated films. Substrates with a larger lattice mismatch (c-Al2O3 ) introduce strain in InxGa1-xN which helps to stabilize the film, however, at the expense of crystalline quality.; Growth of InN nanowires by MOCVD was controlled without the use of templates or catalysts by varying the inlet flow pattern, N/In ratio, growth temperature, and substrate material. A VLS growth mechanism is proposed, however, a VS growth mechanism can be achieved at high N/In ratios. SEM and TEM analysis revealed a core-shell nanowire structure with a single crystal InN core and a poly-crystalline In2O3 shell. Nanowire growth occurs along the [0002] direction with diameters and lengths ranging from 100 to 300 nm and 10 to 40 mum, respectively for a 1 hr growth.; H-MOCVD growth of InN nano- and microrods occurred on different substrates and the nanorod structure was studied by TEM. The polarity of the substrate directly affected the nanorod tip shape and prismatic stacking faults are suggested as the cause for the flower-like growth habit. Variation of growth parameters, such as temperature, N/In ratio, and Cl/In ratio proved to be ineffective at changing the aspect ratio of the nanorods. Increased growth duration produces microrod size dimensions regardless of the chosen growth conditions.
机译:使用MEDICI器件仿真软件对单结和多结InxGa1-xN太阳能电池器件进行了一维建模,以评估基于InxGa1-xN的太阳能电池的潜力。预测单结和5结InxGa1-xN太阳能电池在AM0照射下的电池效率分别为16%和27.4%。确定InxGa1-xN合金的相分离对太阳能电池效率几乎没有负面影响。通过MOCVD在整个组成范围(0≤x≤1)上生长InxGa1-xN合金,并针对衬底材料和生长温度分析相分离。使用530°C的低沉积温度来生产整个组成范围内的亚稳InxGa1-xN / c-Al 2O3薄膜,这是通过MOCVD首次证明的。使用较高的沉积温度和紧密匹配晶格的基底导致相分离的膜。具有较大晶格失配(c-Al2O3)的基板会在InxGa1-xN中引入应变,这有助于使膜稳定,但是会牺牲晶体质量。通过改变入口流型,N / In比,生长温度和衬底材料,可以在不使用模板或催化剂的情况下通过MOCVD控制InN纳米线的生长。提出了VLS生长机制,但是,在高N / In比下可以实现VS生长机制。 SEM和TEM分析揭示了具有单晶InN核和多晶In2O3壳的核-壳纳米线结构。纳米线生长沿[0002]方向生长,直径和长度分别在100到300 nm和10到40 mum的范围内生长1小时。 InN纳米棒和微棒的H-MOCVD生长发生在不同的基板上,并通过TEM研究了纳米棒的结构。基底的极性直接影响纳米棒尖端的形状,并提出棱柱形堆积缺陷是花状生长习性的原因。生长参数的变化(例如温度,N / In比和Cl / In比)被证明对改变纳米棒的长宽比无效。无论选择哪种生长条件,增加的生长持续时间都会产生微棒尺寸尺寸。

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