A high-resolution spectrometer for resonant inelastic X-ray scattering.

摘要

A better understanding of the dynamic behavior of correlated electron systems, such as transition metal compounds, may be realized by improving the energy resolution for resonant inelastic X-ray scattering (RIXS) technique. This dissertation proposes a new spectrometer with a relatively higher resolution, which is based on a back-reflecting sapphire crystal analyzer.;With this improved resolution, RIXS technique was used to measure the low-energy excitations in cupric oxide (CuO) as a function of incident photon energy. The measurements resulted in a remarkable change in the spectra depending on the energy of the incident X-ray beam.