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Stability and current-induced local heating of single molecular junctions.

机译:单分子结的稳定性和电流引起的局部加热。

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摘要

A fundamental and technologically significant issue in molecular electronics, how stable molecular junctions are in the operation, has received little attention. This dissertation presents a study of the stability and current-induced local heating of single molecule (n-alkanedithiol) junctions formed via gold-thiol (Au-S) bonds in toluene, using the scanning tunnelling microscopy (STM)/conducting atomic force microscopy (CAFM) break junction approach at room temperature.; First, the breakdown mechanism of single molecular junctions is studied by measuring the stretching distance and breakdown force with the stretching rate. The non-monotonic dependence is well described by a thermodynamic bond-breaking theory. Several comparative studies demonstrate that the breakdown most likely happens at a Au-Au bond near the Au-S contacts.; Second, by fitting the experimental data with the thermodynamic bond-breaking theory, the average natural lifetime is extracted as 0.05-0.1 seconds, shorter than the observed lifetime. This apparent contradiction is explained by the observation of the bond reformation, which prolongs the lifetime of molecular junctions. The distribution of the dissociation energy barrier is broad, owing to the diverse atomic contact geometries, which leads to an extremely broad distribution in the lifetime varying from nano seconds to several days. This finding indicates that although the molecular junctions are short lived on average, certain contact geometries are considerably more stable.; Third, current-induced local heating leads to a finite increase in the local temperature in the single molecular contact. The local temperature is evaluated by measuring the breakdown force and stretching distance as a function of bias and molecular length. It has been found that for a given molecule, the effective local temperature increases with applied bias, and then decreases after reaching a maximum. At a fixed bias, the effective temperature decreases with molecular length. These experimental findings are in good agreement with hydrodynamic predictions which include both electron-phonon and electron-electron interactions.
机译:分子电子学中一个基本且技术上重要的问题,即操作中的分子结如何稳定,很少受到关注。本文利用扫描隧道显微镜(STM)/导电原子力显微镜研究了通过金-硫醇(Au-S)键在甲苯中形成的单分子(n-烷二硫醇)连接的稳定性和电流诱导的局部加热。 (CAFM)在室温下断开连接方法。首先,通过测量拉伸距离和随着拉伸速率的破坏力,研究单分子连接的破坏机理。热力学键断裂理论很好地描述了非单调依赖性。一些比较研究表明,击穿极有可能发生在Au-S触点附近的Au-Au键上。其次,通过用热力学键断裂理论拟合实验数据,平均自然寿命为0.05-0.1秒,比观察到的寿命短。通过观察键重整可以解释这种明显的矛盾,键重整延长了分子连接的寿命。由于原子接触几何结构的多样性,离解能垒的分布范围很广,这导致寿命范围从纳秒到数天不等的极其广泛的分布。这一发现表明,尽管平均来说分子连接寿命短,但是某些接触几何形状却相当稳定。第三,电流引起的局部加热导致单分子接触中局部温度的有限升高。通过测量击穿力和拉伸距离作为偏倚和分子长度的函数来评估局部温度。已经发现,对于给定的分子,有效局部温度随着施加的偏压而升高,然后在达到最大值后降低。在固定偏差下,有效温度随分子长度而降低。这些实验结果与包括电子-声子和电子-电子相互作用的流体力学预测非常吻合。

著录项

  • 作者

    Huang, Zhifeng.;

  • 作者单位

    Arizona State University.;

  • 授予单位 Arizona State University.;
  • 学科 Engineering Materials Science.
  • 学位 Ph.D.
  • 年度 2007
  • 页码 82 p.
  • 总页数 82
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 工程材料学;
  • 关键词

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