XUV spectroscopic studies of silicon and copper plasmas

摘要

XUV spectra of line-focused laser-produced Si and Cu plasmas,ob-tained with an 1m stigmatic grazing incidence grating spectrograph and a stigmatic grazing incidence flat-field grating spectrograph, were presented. Wavelengths were determined and compared with calculated values. The spectra show that the plasmas produced at the chosen irradiance have predominately emitted spectral lines from transitions of Li-like Si ions and Na-like Cu ions, respectively. The spectral data are useful for the recombination pumping soft X-ray laser study of the Li- and Na-like ions.