An On-Die Weighted Random Pattern Test Scheme Using Pre-stored Weights in On-Die Caches

摘要

This paper describes a random logic BIST method, which continuously retrieves pre-stored weights from on-die caches and feeds on-die weighted random pattern generators to perform on-chip self testing. This method can be used to apply test patterns at operational speed and it takes less time to apply the test at various test platforms including field test.