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Experimental Evidence that the Plasma-assisted MBE Growth of Nitride Alloys is a Liquid Phase Epitaxy Process

机译:氮化铝合金的等离子体辅助MBE生长是液相外延过程的实验证据

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摘要

In this paper we propose that under Ga-rich conditions the growth of Ill-Nitride semiconductors by plasma-assisted MBE takes place though saturation of the metallic Ga covering the surface of the growing film with nitrogen, alloy constituents and impurities. According to this model the growth process is a liquid phase epitaxy (LPE) rather than vapor phase epitaxy. Experimental evidence is presented in support of this model. Such include, for example, that the growth rate of GaN does not decrease at temperatures in excess to 800 ℃, a result attributed to higher solubility of active nitrogen in Ga at higher temperatures. Also the metallic Ga in the surface of the film controls the incorporation of impurities and is responsible for the introduction of compositional inhomogeneities and thus band structure potential fluctuations in AlGaN due to lateral statistical fluctuations of the thickness of Ga in the surface.
机译:在本文中,我们提出,在富含Ga的条件下,虽然覆盖了生长膜表面的金属Ga充满了氮,合金成分和杂质,但等离子体辅助MBE的生长还是导致了氮化铝半导体的生长。根据该模型,生长过程是液相外延(LPE),而不是气相外延。实验证据支持该模型。例如,这包括GaN的生长速率在超过800℃的温度下不会降低,这归因于活性氮在较高温度下在Ga中的溶解度较高。膜表面中的金属Ga也会控制杂质的掺入,并导致成分不均匀性的引入,从而由于表面Ga厚度的横向统计波动而导致AlGaN中的能带结构电势波动。

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