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Characterization of Si Hybrid CMOS Detectors for use in the Soft X-ray Band

机译:用于软X射线波段的Si混合CMOS检测器的特性

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We report on the characterization of four HAWAII Hybrid Si CMOS detectors (HCD) developed for use as X-ray detectors as part of a joint program between Penn State University and Teledyne Imaging Sensors (TIS). Interpixel capacitive crosstalk (IPC) has been measured for standard H1RG detectors as well as a specially developed H2RG that uses a unique bonding structure. The H2RG shows significant reduction in IPC, as reported by Griffith et al. 2012. Energy resolution at 1.5 & 5.9 keV was measured as well as read noise for each detector. Dark current as a function of temperature is reported from 150-210 K and dark current figures of merit are estimated for each detector. We also discuss upcoming projects including testing of a new HCD called the Speedster-EXD. This prototype detector will have a low noise, high gain CTIA to reduce IPC and read noise as well as in-pixel CDS and event flagging. In the coming year PSU and TIS will begin work on a project to incorporate CTIA and CDS circuitry into the ROIC of a HAWAII HCD like detector to satisfy the small pixel and high rate needs of future X-ray observatories.
机译:我们报告了宾夕法尼亚州立大学和Teledyne成像传感器(TIS)联合计划的一部分,开发了四个用作X射线探测器的HAWAII混合Si CMOS探测器(HCD)的特性。像素间电容串扰(IPC)已针对标准H1RG检测器以及使用独特键合结构的专门开发的H2RG进行了测量。 H2RG显示IPC显着降低,如Griffith等报道。 2012年。测量了1.5和5.9 keV的能量分辨率以及每个探测器的读取噪声。据报道,暗电流是温度的函数,范围是150-210 K,每个探测器的暗电流品质因数都被估算。我们还将讨论即将进行的项目,包括测试称为Speedster-EXD的新HCD。该原型检测器将具有低噪声,高增益CTIA,以减少IPC和读取噪声以及像素内CDS和事件标记。在未来的一年中,PSU和TIS将开始进行将CTIA和CDS电路整合到HAWAII HCD类探测器的ROIC中的项目,以满足未来X射线观测站的小像素和高速率需求。

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