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A theoretical comparison of Fresnel based digital holography and phase retrieval from the transport of intensity equation

机译:基于菲涅耳的数字全息和强度方程传输的相位检索的理论比较

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摘要

Optical systems that can recover both the amplitude and phase of a scattered wave field are important for a range of different practical imaging and metrology applications. In this manuscript we examine two different techniques: (A) Fresnel based digital holography and (B) Teague's transport of intensity phase retrieval technique, using a special analytical function that serves to act as the scattered wave field we would like to recover. Nowadays both systems use modern CCD or CMOS arrays to make the necessary intensity measurements. In system (A) an ideal plane wave reference field is required and should overlap, and interfere, with the scattered field at at the CCD plane. The resulting intensity distribution recorded by the CCD is a digital hologram. If several captures are recorded, where the phase of the reference has been changed (stepped) between captures, it is possible to recover an approximation to the complex amplitude of the scattered wave field. In system (B) no reference field is needed, which is a significant advantage from a practical implementation point of view. Rather, the intensity of the scattered wave field has to be measured at two axially displaced planes. We expect that the performance of both systems will be fundamentally limited by at least three separate factors, (ⅰ) the finite extent of CCD array, (ⅱ) the finite extent of the CCD pixels which average the light intensity incident upon them, and (ⅲ) the sampling operation which occurs because the intensity is recorded at a set of uniformly displaced discrete locations. In this manuscript, we examine how factors (ⅰ) and (ⅲ), effect the imaging performance of each system by varying the spatial frequency extent of the scattered wave field. We find that system A has superior performance compared to system B.
机译:可以恢复散射波场的幅度和相位的光学系统对于一系列不同的实际成像和计量应用很重要。在本手稿中,我们研究了两种不同的技术:(A)基于菲涅耳的数字全息技术;以及(B)使用特殊的分析功能充当我们想要恢复的散射波场的Teague传输强度相位检索技术。如今,这两个系统都使用现代CCD或CMOS阵列进行必要的强度测量。在系统(A)中,理想的平面波参考场是必需的,并且应与CCD平面处的散射场重叠并干涉。 CCD记录的强度分布是数字全息图。如果记录了几次捕获,其中捕获之间的参考相位已更改(步进),则可以恢复到散射波场复振幅的近似值。在系统(B)中,不需要参考字段,从实际实现的角度来看,这是一个很大的优势。相反,必须在两个轴向位移的平面上测量散射波场的强度。我们希望这两个系统的性能都将受到至少三个独立因素的基本限制,(ⅰ)CCD阵列的有限范围,(ⅱ)CCD像素的有限范围,它们平均入射到它们的光强度,并且( ⅲ)发生采样操作的原因是因为强度是在一组均匀位移的离散位置记录的。在本手稿中,我们研究了(ⅰ)和(ⅲ)因素如何通过改变散射波场的空间频率范围来影响每个系统的成像性能。我们发现与系统B相比,系统A的性能更高。

著录项

  • 来源
    《Tribute to H. John Caulfield》|2013年|88330G.1-88330G.10|共10页
  • 会议地点 San Diego CA(US)
  • 作者单位

    Institut fuer Mikro-und Nanotechnologien, Macro-Nano, Fachgebiet Optik Design Technische Universitaet Ilmenau, P.O. Box 10 05 65, 98684 Ilmenau, Germany;

    Institut fuer Mikro-und Nanotechnologien, Macro-Nano, Fachgebiet Optik Design Technische Universitaet Ilmenau, P.O. Box 10 05 65, 98684 Ilmenau, Germany;

    Institut fuer Mikro-und Nanotechnologien, Macro-Nano, Fachgebiet Technische Optik Technische Universitaet Ilmenau, P.O. Box 10 05 65, 98684 Ilmenau, Germany;

    Institut fuer Mikro-und Nanotechnologien, Macro-Nano, Fachgebiet Technische Optik Technische Universitaet Ilmenau, P.O. Box 10 05 65, 98684 Ilmenau, Germany;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    speckle metrology; phase retrieval; holography; statistical optics;

    机译:斑点计量相位检索;全息术统计光学;

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