首页> 外文会议>Thrid Workshop on Nanoscience amp; Nanotechnology: Nanostructured Materials Application and Innovation Transfer Nov 30-Dec 1, 2001 Sofia, Bulgaria >DEVELOPMENT OF CONTROLLABLE CHEMICAL DEPOSITION TECHNIQUES FOR FABRICATION OF NANOCRYSTALLINE SEMICONDUCTING METAL SELENIDE THIN FILMS ― A POSSIBLE ROUTE TO CONTROL THE BAND-GAP ENERGY AND OTHER RELEVANT PARAMETERS OF SEMICONDUCTING NANOMATERIALS
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DEVELOPMENT OF CONTROLLABLE CHEMICAL DEPOSITION TECHNIQUES FOR FABRICATION OF NANOCRYSTALLINE SEMICONDUCTING METAL SELENIDE THIN FILMS ― A POSSIBLE ROUTE TO CONTROL THE BAND-GAP ENERGY AND OTHER RELEVANT PARAMETERS OF SEMICONDUCTING NANOMATERIALS

机译:纳米晶半导体金属薄膜制备的可控化学沉积技术的发展-控制带隙能量和半导体纳米材料的其他相关参数的可能路线

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Controllable chemical techniques for fabrication of nanocrystalline semiconducting metal selenide thin films are presented. The obtained thin films materials are identified using the method of X-ray diffraction. On the basis of recorded X-ray diffraction patterns, using Debye-Scherrer equation, the average crystal sizes of chemically deposited thin films are estimated. For investigation of their optical properties, UV-VIS spectra are recorded. Within the framework of parabolic approximation for the dependence of electronic energy on the wave vector, according to the Fermi's golden rule, the recorded optical spectra are correspondingly mathematically transformed. On the basis of dependence of (μhv)~(1) vs.hv the type of electronic transition is determined and the optical band gap energy (at room temperature) is calculated for each particular case. The calculated values of band gap energies for the investigated thin film materials are higher than the corresponding bulk values in those cases where these data are available. This finding is attributed to the size quantization effects. Since the crystal size is determined by deposition conditions, a possibility for controlling the band gap energies, as well as other relevant parameters of semiconducting thin films is outlined, which is of fundamental importance in nanoscience and nanotechnology of these materials.
机译:提出了可控化学技术,用于制造纳米晶半导体金属硒化物薄膜。使用X射线衍射的方法鉴定所获得的薄膜材料。根据记录的X射线衍射图,使用Debye-Scherrer方程估算化学沉积薄膜的平均晶体尺寸。为了研究其光学性质,记录了UV-VIS光谱。在根据电子能量对波矢量的依赖的抛物线近似框架内,根据费米黄金定律,对记录的光谱进行了相应的数学转换。基于(μhv)〜(1 / n)与hv的依存关系,确定电子跃迁的类型,并针对每种特定情况计算光带隙能量(在室温下)。在可获得这些数据的情况下,所研究的薄膜材料的带隙能量的计算值高于相应的体积值。该发现归因于尺寸量化效应。由于晶体尺寸是由沉积条件决定的,因此概述了控制带隙能量以及半导体薄膜的其他相关参数的可能性,这在这些材料的纳米科学和纳米技术中至关重要。

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