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Non-adaptive Complex Group Testing with Multiple Positive Sets

机译:具有多个正集的非自适应复杂组测试

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Given n items with at most d of them having a particular property (referred as positive items), a single test on a selected subset of them is positive if the subset contains any positive item. The non-adaptive group testing problem is to design how to group the items to minimize the number of tests required to identify all positive items in which all tests are performed in parallel. This problem is well-studied and algorithms exist that match the lower bound with a small gap of log d asymptoticically. An important generalization of the problem is to consider the case that individual positive item cannot make a test posi tive, but a combination of them (referred as positive subsets) can do. The problem is referred as the non-adaptive complex group testing. Assume there are at most d positive subsets whose sizes are at most s, existing algorithms either require Ω(log~s n) tests for general n or O((_d~(s+d)) log n) tests for some special values of n . However, the number of items in each test cannot be very small or very large in real situation. The above al gorithms cannot be applied because there is no control on the number of items in each test. In this paper, we provide a novel and practical derandomized algorithm to construct the tests, which has two important properties. (1) Our algorithm requires only O ((d + s)~(d+s+1)/(d~ds~s) log n) tests for all positive integers n which matches the upper bound on the number of tests when all positive subsets are singletons, i.e. s = 1. (2) All tests in our algorithm can have the same number of tested items k. Thus, our algorithm can solve the problem with additional constraints on the number of tested items in each test, such as maximum or minimum number of tested items.
机译:给定n个项,其中最多d个具有特定属性(称为肯定项),如果子集包含任何肯定项,则对所选子集的单个测试为肯定。非自适应分组测试问题是设计如何对项目进行分组,以最大程度地减少识别所有并行执行所有阳性项目所需的测试数量。对这个问题进行了深入研究,并且存在渐近地将下限与log d的小间隙匹配的算法。该问题的一个重要概括是考虑以下情况:单个肯定项目不能构成测试阳性,但可以将它们组合(称为肯定子集)进行测试。该问题称为非自适应复杂组测试。假设最多有d个正子集,其大小最大为s,对于常规n的现有算法,要么需要Ω(log〜sn)测试,要么对某些特殊值进行O((_ d〜(s + d))log n)测试。 n。但是,在实际情况下,每个测试中的项目数不能很小或很大。由于无法控制每个测试中的项目数,因此无法应用上述算法。在本文中,我们提供了一种新颖且实用的去随机化算法来构建测试,该算法具有两个重要特性。 (1)我们的算法只要求O((d + s)〜(d + s + 1)/(d〜ds〜s)log n)个测试对所有正整数n进行匹配,当满足测试次数上限时所有正子集都是单例,即s =1。(2)我们算法中的所有检验可以具有相同数量的被检验项k。因此,我们的算法可以解决每个测试中被测项目数的额外限制(例如最大或最小被测项目数)的问题。

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