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SPECTRAL INFORMATION EXTRACTION BY MEANS OF MS+PAN FUSION

机译:通过MS + PAN融合手段提取光谱信息

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摘要

This paper deals with multi-spectral (MS) and panchromaticrn(Pan) image fusion based on redundant multiresolutionrnanalysis (MRA). Lower-resolution MS bandsrnare sharpened by injecting high-pass details takenrnfrom the higher-resolution Pan image. Crucial point isrnmodelling the relationships between detail coefficientsrnof a generic MS band and the Pan image at the samernresolution. Once calculated at the coarser resolution,rnwhere both types of data are available, such a modelrnshall be extended to the finer resolution to weight the Panrndetails to be injected. Two injection models embeddedrnin an "`a trous" wavelet decomposition will be describedrnand compared on a test set of very high resolutionrnQuickBird MS+Pan data. One works on approximationsrnand provides a partial unmixing of coarse MS pixelsrnvia high-resolution Pan. Another is based on spectralrnfidelity of the merged image to the original MS data.rnFusion comparisons on spatially degraded data, ofrnwhich higher-resolution true MS data are available forrnreference, show that the former yields better results thanrnthe latter, in terms of both spatial and spectral fidelity.
机译:本文研究了基于冗余多分辨率分析(MRA)的多光谱(MS)和全色(Pan)图像融合。通过注入从高分辨率的Pan图像中获取的高通细节,可以锐化分辨率较低的MS波段。关键点模型化了通用MS波段的细节系数与相同分辨率下的Pan图像之间的关系。一旦以较粗略的分辨率(在两种数据均可用的情况下)进行计算,则应将此类模型扩展到较细的分辨率,以对要注入的Pandedetails进行加权。将描述嵌入“小波”小波分解中的两个注入模型,并在非常高分辨率的QuickBird MS + Pan数据的测试集上进行比较。一种近似方法可以通过高分辨率的Pan提供部分MS粗像素的混合。另一个是基于合并图像相对于原始MS数据的频谱保真度。rn对空间退化数据的融合比较(其中更高分辨率的真实MS数据可供参考)显示,在空间和频谱方面,前者的效果要优于后者。保真。

著录项

  • 来源
  • 会议地点 Madrid(ES)
  • 作者单位

    IFAC–CNR: Institute of Applied Physics "Nello Carrara', Italian National Research CouncilrnVia Panciatichi, 64, 50127 Firenze (Italy), B.Aiazzi@ifac.cnr.it;

    DET-UniFI: Department of Electronics and Telecommunications, University of FirenzernVia Santa Marta, 3, 50139 Firenze (Italy), Alparone@lci.det.unifi.it;

    IFAC–CNR: Institute of Applied Physics "Nello Carrara', Italian National Research CouncilrnVia Panciatichi, 64, 50127 Firenze (Italy) S.Baronti@ifac.cnr.it;

    DII-UniSI: Department of Information Engineering, University of SienarnVia Roma, 56, 53100 Siena (Italy) Garzelli @dii.unisi.it;

    DII-UniSI: Department of Information Engineering, University of SienarnVia Roma, 56, 53100 Siena (Italy) Nencini@dii.unisi.it;

    IFAC–CNR: Institute of Applied Physics "Nello Carrara', Italian National Research;

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  • 正文语种 eng
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  • 入库时间 2022-08-26 13:47:56

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