CSIR-Central Electronics Engineering Research Institute, CSIR Madras Complex, Chennai, India,Academy of Scientific and Innovative Research, CSIR-SERC, Chennai, India;
CSIR-Central Electronics Engineering Research Institute, CSIR Madras Complex, Chennai, India,Academy of Scientific and Innovative Research, CSIR-SERC, Chennai, India;
CSIR-Central Electronics Engineering Research Institute, CSIR Madras Complex, Chennai, India,Academy of Scientific and Innovative Research, CSIR-SERC, Chennai, India;
CSIR-Central Electronics Engineering Research Institute, CSIR Madras Complex, Chennai, India,Academy of Scientific and Innovative Research, CSIR-SERC, Chennai, India;
Terahertz; Reflection mode; CW THz system; Tablet coating thickness;
机译:太赫兹波反射测量法测量热障涂层的折射率和面漆厚度
机译:太赫兹在线传感器,用于在薄膜包衣过程中实时直接测量单个片剂的包衣厚度
机译:基于Terahertz基涂层厚度测量测定光降解对膜涂层镍氢片片的影响
机译:使用连续波Terahertz反射光谱法测量片剂涂层的厚度测量
机译:连续波太赫兹频谱分析和成像,用于炸药检测和安检
机译:用太赫兹脉冲光谱和成像分析商品盐酸环丙沙星一水合物片的包衣和密度分布
机译:太赫兹脉冲成像和近红外光谱的快速,无损分析片剂涂层厚度和均匀性的比较