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Scan blindness in one-layer microstrip antenna arrays

机译:一层微带天线阵列中的扫描失明

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摘要

The article considers the problem of scan blindness in microstrip antenna arrays leading to the deterioration of radiation pattern for a range of scanning angles. The anticipated future wide implementation of integral antennas for mobile and fixed service communication systems with beamforming and MIMO capabilities requires the analysis of this problem and the means to combat it. Analysis of this problem and a method to determine blind scan angles are given as well as relationship between one-layer dielectric substrate parameters and element spacing is obtained and presented in the form of curves of maximum permissible scan angles.
机译:本文考虑了微带天线阵列中的扫描盲性问题,该问题会导致一定范围的扫描角度下辐射图的恶化。对于具有波束成形和MIMO功能的移动和固定服务通信系统,集成天线的预期在未来的广泛应用将需要对此问题进行分析并采取相应的措施。对该问题进行了分析,并给出了确定盲扫描角的方法,并获得了单层介电基片参数与元件间距之间的关系,并以最大允许扫描角的曲线形式表示。

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