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In-Plane Ferroelectricity in Strontium Titanate Thin Films

机译:钛酸锶薄膜中的平面铁电

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摘要

The results of structural and electrical characterizations of SrTiO_3 thin films deposited onto LaAlO_3 substrates by pulsed laser deposition technique are presented. The appearance of the ferroelectric phase in these films has been experimentally documented, the transition temperature being in the range of 90-120K. The hysteresis loops have been monitored in a wide temperature range by using thin film planar capacitors, the driving field being predominantly in the plane of the film. The switching properties of the films has been studied at low temperatures (~25 K) and well saturated loops have been observed with relatively low coercive field (<6kV/cm for 10μm gap). The presence of the imprint phenomenon has been also found at low temperatures. The microstructure of the investigated SrTiO_3 thin films has been studied by using a high resolution transmission electron microscope (TEM). It has been found that the annealed and as-deposited thin films, being of the same composition, have quite different microstructures. The difference observed in the polarization response of the films is related to that in their microstructure.
机译:给出了通过脉冲激光沉积技术在LaAlO_3衬底上沉积的SrTiO_3薄膜的结构和电学表征的结果。这些膜中铁电相的出现已通过实验证明,转变温度在90-120K的范围内。通过使用薄膜平面电容器,可以在很宽的温度范围内监视磁滞回线,驱动场主要位于薄膜平面内。已经在低温(〜25 K)下研究了薄膜的开关特性,并且观察到了良好饱和的回路,并且矫顽场相对较低(对于10μm的间隙,<6kV / cm)。在低温下也发现了压印现象的存在。使用高分辨率透射电子显微镜(TEM)研究了所研究的SrTiO_3薄膜的微观结构。已经发现,具有相同组成的退火和沉积的薄膜具有非常不同的微观结构。薄膜的极化响应中观察到的差异与薄膜的微观结构有关。

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