AN AES AND XPS STUDY OF THE STAINLESS STEEL F518 ON PASSIVATION FILM IN H_2SO_4 SOLUTION CONTAINING COPPER IONS

摘要

An Auger electron spectroscopy (AES), and X-ray photo-electron spectroscopy (XPS) have been used to study the effects of copper ion on an austenitic stainless steel (F518) in 20%H_2SO_4 solution. The results indicated that the surface passive films of F518 in 20% H_2SO_4 containing 0 and 2500ppm Cu~(2+) ions were enriched in Mo~(6+), Cr~(3+) and oxidized iron , and the surface passive film of F518 in 20% H_2SO_4 containing 35000ppm Cu~(2+) ions was enriched in Mo~(4+), Cr~(3+), metallic copper and oxidized iron. The enrichment of metallic copper on the alloy surface film in the solution, at higher Cu~(2+) ions concentration, improved significantly passivation of the F518 in sulphuric media.