Radiation Testing to Assess Damage in Electronics for Deep Space Missions

摘要

Deep space missions will involve exposure to significant levels of ionizing radiationrnthat can damage electronics used in the spacecraft systems for such missions. In space thernradiation is comprised of three distinct natural sources (galactic cosmic rays, trapped belts andrnsolar energetic particle events), and these can induce three primary types of effects in thernelectronics (total ionizing dose, displacement damage and single event effects). These effects arerndiscussed along with the different facilities available for testing devices for each effect, and somernpertinent examples of device degradation are shown.