Influence of gas mixing ratio on the secondary electron emission coefficient (γ) of MgO single crystals with different orientation and MgO protective layer in surface discharge AC-PDPs

摘要

The secondary electron emission coefficient γ of MgO single crystals and the difference of gas mixing ratio of Xe to Ne on secondary electron emission coefficient γ have been investigated by γ -focused ion beam system. It is found that the MgO single crystals of (111) crystallinity has the highest secondary electron emission coefficient γ from 0.09(0.03) up to 0.16(0.04), while from 0.07(0.02) to 0.15(0.03) for (200) and from 0.06(0.01) to 0.13(0.02) for (220) crystallinities for operating Ne(Xe) ions ranging from 50eV to 200eV throughout this experiment. And it is found that the secondary electron emission coefficient γ ranged from 0.03 up to 0.06 for Ne-Xe mixtures are much smaller than those of 0.09 up to 0.16 for pure Ne ions under accelerating voltage ranged from 50V to 200V.