首页> 外文会议>Sixth European Conference on Thermal Plasma Processes, May 30-Jun 3, 2000, Strasbourg, France >CHARACTERISATION OF AL_2O_3 PLASMA SPRAYING BY ATOMIC EMISSION SPECTROSCOPY AND NEAR INFRARED PYROMETRY
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CHARACTERISATION OF AL_2O_3 PLASMA SPRAYING BY ATOMIC EMISSION SPECTROSCOPY AND NEAR INFRARED PYROMETRY

机译:原子发射光谱和近红外热释光法表征AL_2O_3等离子喷涂

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Plasma temperature measurement and 2D light intensity mapping of an industrial plasma spraying equipment developed by 2PS (14-45 kW, Ar/H_2 plasma, Al_2O_3 powder) is performed based on atomic emission spectroscopy and near infrared pyrometry. The influence of the process parameter variations onto the plasma electron density with and without Al_2O_3 powder has been identified. Plasma temperature and electron density are determined by Atomic Emission Spectroscopy (a monochromator with focal length of 320 mm is used, allowing spectra acquisitions on a wide spectral range up to 70 nm) based on the H-beta line broadening in the assumption of plasma equilibrium. A 2D pyrometer (vision zone 10 x 10 mm~2) with the 0.860 μm spectral band has been applied to obtain the radiative intensity mapping of the jet. A 1 spot monochromatic pyrometer (in the 1.5 μm spectral range) sighted to the impact area has been used to control in real time the substrate brightness temperature versus process parameters. The following variations of operational conditions were studied: hydrogen flow rate (0 -15 1/min), powder flow rate (10 - 20 g/min) and current (500 - 700 A), argon flow rate was fixed (70 1/min). It has been found that along the jet axis (up to 40 mm from the nozzle) the temperature and the electron density vary in the range 13 000 - 11 000 K and 1.4 10~(17) - 4 10~(16) cm~(-3) respectively. The 2D radiation intensity fields are rather sensitive to the variation of current and H_2 flow rate and visualise the plasma flow pattern.
机译:基于原子发射光谱和近红外高温测定法,对由2PS开发的工业等离子喷涂设备(14-45 kW,Ar / H_2等离子,Al_2O_3粉末)进行等离子温度测量和2D光强度映射。已经确定了在有和没有Al_2O_3粉末的情况下,工艺参数变化对等离子体电子密度的影响。等离子体温度和电子密度由原子发射光谱法确定(使用焦距为320 mm的单色仪,允许在高达70 nm的宽光谱范围内进行光谱采集),基于假设等离子体平衡的H-beta线变宽。已使用光谱带为0.860μm的2D高温计(视区10 x 10 mm〜2)来获得射流的辐射强度图。观察到撞击区域的1点单色高温计(在1.5μm光谱范围内)已用于实时控制基板亮度温度与工艺参数之间的关系。研究了以下运行条件变化:氢气流量(0 -15 1 / min),粉末流量(10-20 g / min)和电流(500-700 A),氩气流量固定(70 1 /分钟)。已经发现,沿着射流轴(距喷嘴最多40 mm),温度和电子密度在13000-11000 K和1.4 10〜(17)-4 10〜(16)cm〜范围内变化(-3)。 2D辐射强度场对电流和H_2流量的变化非常敏感,并可视化了等离子体的流型。

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