Department of Electrical, Electronic, and Communication Engineering, Chuo University, Tokyo, Japan;
Department of Electrical, Electronic, and Communication Engineering, Chuo University, Tokyo, Japan;
Department of Electrical, Electronic, and Communication Engineering, Chuo University, Tokyo, Japan;
Reliability; Flash memories; Charge measurement; Shape; Error correction codes; Modulation; Decoding;
机译:带有自适应码字纠错码的非易失性随机存取存储器和NAND闪存集成固态驱动器,可将原始误码率提高3.6倍,功耗降低97%
机译:RbWL:基于新近度的静态磨损均衡,可延长NAND闪存系统的使用寿命并减少开销
机译:通过改变基于40 nm Tao_x的RERAM的重置电压来减少85%耐久性误差和数据保留寿命
机译:3D-TLC NAND闪存的可靠页面误差减少,数据开销减少40%,数据保留时间增加5.0倍
机译:使用大规模NAND闪存的固态数据存储电路和系统。
机译:非对称编程:基于MLC NAND闪存的传感器系统的高度可靠的元数据分配策略
机译:非对称编程:基于mLC NaND闪存的传感器系统的高可靠元数据分配策略