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Fast Single-Photon Imager acquires 1024 pixels at 100 kframe/s

机译:快速单光子成像仪以100 kframe / s的速度采集1024个像素

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We present the design and we discuss in depth the operating conditions of a two-dimensional (2-D) imaging array of single-photon detectors that provides a total of 1024 pixels, laid out in 32 rows by 32 columns array, integrated within a monolithic silicon chip with dimensions of 3.5 mm × 3.5 mm. We employed a standard high-voltage 0.35μm CMOS fabrication technology, with no need of any custom processing.rnEach pixel consists of one Single-Photon Avalanche Diode (SPAD) and a compact front-end analog electronics followed by a digital processing circuitry. The in-pixel front-end electronics senses the ignition of the avalanche, quenches the detector, provides a pulse and restores the detector for detecting a subsequent photon. The processing circuitry counts events (both photon and unwelcome "noise" ignition) within user-selectable integration time-slots and stores the count into an in-pixel memory cell, which is read-out in 10 ns/pixel. Such a two-levels pipeline architecture allows to acquire the actual frame while contemporary reading out the previous one, thus achieving a very high free-running frame rate, with negligible inter-frame dead-time. Each pixel is therefore a completely independent photon-counter.rnThe measured Photo Detection Efficiency (PDE) tops 43% at 5V excess-bias, while the Dark-Counting Rate (DCR) is below 4kcps (counts per second) at room temperature. The maximum frame-rate depends on the system clock; with a convenient 100MHz system clock we achieved a free-running speed of 100 kframe/s from the all 1024 pixels.
机译:我们提出设计并深入讨论单光子探测器的二维(2-D)成像阵列的工作条件,该阵列提供了总共1024个像素,以32行x 32列阵列的形式排列,并集成在一个尺寸为3.5 mm×3.5 mm的单片硅芯片。我们采用了标准的高压0.35μmCMOS制造技术,无需任何定制处理。每个像素由一个单光子雪崩二极管(SPAD)和一个紧凑的前端模拟电子器件组成,随后是数字处理电路。像素内前端电子设备感测到雪崩的起火,淬灭检测器,提供脉冲并恢复检测器以检测后续的光子。处理电路对用户可选的积分时隙内的事件(光子和不受欢迎的“噪声”点火)进行计数,并将计数存储到像素内存储单元中,以10 ns /像素的速度读出。这种两级流水线体系结构允许在获取当前帧的同时读取当前的帧,从而实现了非常高的自由运行帧率,而帧间停滞时间却可以忽略不计。因此,每个像素都是一个完全独立的光子计数器。在室温下,5V的过高偏压下测得的光检测效率(PDE)最高为43%,而室温下的暗计数率(DCR)低于4kcps(每秒计数)。最大帧速率取决于系统时钟。通过方便的100MHz系统时钟,我们从所有1024个像素中获得了100 kframe / s的自由运行速度。

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