In-situ observations and measurements of mechanically induced grain boundary migration in a scanning electron microscope

摘要

A novel set-up developed to continuously observe and measure stress driven grain boundary migration is presented. A commercially available tensile/compression SEM unit was utilized for in-situ observations of mechanically loaded samples at elevated temperatures up to 850℃ by recording orientation contrast images of bicrystal surfaces. Two sample holders for application of a shear stress to the boundary in bicrystals of different geometry were designed and fabricated. The results of first measurements are presented.