Laser diode degradation: important understanding for material and structural improvements

摘要

The performance and reliability of laser diodes depend on their structural design and material quality. To further improve their performance and reliability, it is essential to know the weak links in the device structure. Crystalline defects generated in degraded devices directly or indirectly pin-point the weak links in the device structure. Device failure mode analysis on degraded devices therefore provides an efficient way for identifying material issues for quality improvement. A few example will be given to illustrate the process.