Circuit Design Methodologies for Test Power Reduction in Nano-Scaled Technologies

摘要

Test power has emerged as an important design concern in nano-scaled technologies. The BIST circuitry for periodic self-test consumes significant power in hand-held electronic devices to increase battery lifetime. Reduced test power of a module allows parallel testing of multiple embedded cores in an IC. Peak and average power reduction during test contribute to enhanced reliability and improved yield. In this paper, we present circuit design methodologies to reduce test power in nano-scaled technologies. In addition to this advantage of reduced supply, testing concept is mentioned for initial testing which will give dual benefit of power and test time reduction.