Testing analog electronic circuits using N-terminal network

摘要

A new test method using multidimensional search space (TMMSS) for analog electronic circuits is presented. During test mode the circuit under test is connected to active N-terminal network. The structure and values of elements of this network is selected (by heuristic particle swarm optimization algorithm) in way that the best localization/identification of faults is obtained. The differences between proposed method and others existing methods (specially oscillating testing method) have been described. The proposed method allows to increase observability of the circuit under test, which is very important if integrated circuits are tested. In this paper, the validity of described method has been verified throughout practical myoelectrical filtering circuit (taken from note "Testing Analog and Mixed-Signal Integreted Circuits Using Oscillation-Test Method" K. Arabi and B. Kaminska). The obtained simulations results shows, that presented method assure a high degree of localization of CUT faults.