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An efficient passivity test for descriptor systems via canonical projector techniques

机译:通过规范的投影仪技术对描述符系统进行有效的无源测试

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An efficient passivity test based on matrix chain and canonical projector techniques is proposed for descriptor systems (DSs) commonly encountered in VLSI modeling. The test entails a natural flow that first evaluates the index of a DS, followed by possible decoupling into its proper and improper (if any) subsystems. Compared to the recent DS passivity tests using linear matrix inequality (LMI)-based extended positive real lemma or skew-Hamiltonian/Hamiltonian (SHH) transformations, numerical examples show that the proposed projector approach is significantly more efficient. Explicit state space formulations for the decoupled subsystems that facilitate further processing such as passivity enforcement and model order reduction are also derived.
机译:针对VLSI建模中常见的描述符系统(DS),提出了一种基于矩阵链和规范投影仪技术的有效无源测试。该测试需要自然流程,该流程首先评估DS的索引,然后可能将其解耦到其适当和不合适的子系统(如果有)。与最近的使用基于线性矩阵不等式(LMI)的扩展正实引理或偏斜哈密顿/哈密顿(SHH)变换的DS无源测试相比,数值示例表明,所提出的投影仪方法明显更有效。还导出了用于解耦子系统的显式状态空间公式,这些公式有助于进一步处理,例如无源性强制执行和模型阶数减少。

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