AN IN-LINE SCANNING UV-VIS-NIR PROCESS MDNITOR

摘要

Use of scanning UV-Vis-NIR Spectrophotometry in process control has been limited to taking a sample to the lab. By employing recent advances in optical waveguides with a unique optical system it has been possible to design a system that allows for in-line monitoring with performance that is comparable or superior to laboratory instruments.rnThe process monitor to be described allows measurement of absorbance spectra at distances of over 100 meters from the instrument. In addition, the utility of such a system in hostile environments be they corrosive, radioactive, explosive, high or low temperature or pressure will be described.rnDifferent probes and detectors are discussed including the relative advantages and disadvantages of rapid scanning compared to diode array detectors.