首页> 外文会议>Precision Mechanical Measurement: (Preliminary Program of ISIST'2002) Vol.4 >Thickness Measurement of Multi-layered Structure by Eddy Current Testing
【24h】

Thickness Measurement of Multi-layered Structure by Eddy Current Testing

机译:涡流测试法测量多层结构的厚度

获取原文

摘要

Based on the work of Luquire and Cheng, the impedance change model of a probe coil of rectangular cross section above a structure with an arbitrary number of parallel layers is studied. Following this model, the thickness measurement of multi-layered configurations is investigated and simulation programs are developed. The experimental eddy current detection system is developed and methods of the impedance measurements inversion are proposed. The agreement between calculated and observed values is within the limits of experimental error and the results show that the forward model and inverse techniques studied in this paper are feasible and reasonable.
机译:基于Luquire和Cheng的工作,研究了具有任意数量平行层的结构上方矩形截面的探测线圈的阻抗变化模型。根据该模型,研究了多层结构的厚度测量并开发了仿真程序。开发了实验涡流检测系统,提出了阻抗测量反演的方法。计算值与实测值之间的一致性在实验误差的范围内,结果表明本文所研究的正向模型和反演技术是可行和合理的。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号