Response of a CsI/amorphous-Si flat panel detector as function of incident x-ray angle

摘要

Two mechanisms for MTF dependence on incident x-ray angle are demonstrated by an experimental technique that separates the two phenomena. The dominant effect is that travel of x-ray photons through the scintillator at non-normal incidence involves an in-plane component. This mechanism leads to a significant but deterministic blurring of the incident image, but has no effect on the noise transfer characteristics of the detector. A secondary effect is that at large angles to the surface normal, x-ray-to-optical conversion occurs at positions in the scintillator further away from the photodiode surface. This leads to a small net decrease in MTF and NPS at angles above 60degrees. The deterministic character of the angular dependence of gain, MTF and NPS leads to the conclusion that sufficient angular range can be supported by this detector construction. Excellent functionality in the context of tomography is expected.