Separating the uncorrelated noise from the correlated detector noise of flat panel systems in order to quantify flat panel noise easily

摘要

One big advantage in terms of image quality of modern flat panel detector systems compared to CR systems beside the better DQE of these systems is the possibility to correct for inhomogeneities of the X-ray beam and the detector (flat field correction) as well as for bad pixels. However, the used correction methods are taking a lot of time or do not cover all possible combinations of radiation quality and exposure used for patient imaging. A method is presented to achieve these correction images very easily by using a proposed method for comparing two images. This method, which has so far been used for certain noise measurements and in some cases noise reduction, can also be used for separating correlated from uncorrelated noise by correlating in frequency sub-bands the information of two images. In this study it is proven, that the uncorrelated noise image of two expositions is very similar to the correction image gained just before the two exposures. That allows to calibrate a detector quite more often and for much more beam qualities / exposures than before to achieve a better correction and another possibility of constancy testing for flat panel detectors, because the proposed method is so sensitive that it will detect single pixel changes within the detector.