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Photorefractive properties of reduced BaTiO3:Rh at wavelengths of 514 nm and 633 nm

机译:还原的BaTiO3:Rh在514 nm和633 nm波长下的光折变特性

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Abstract: We report that two beam coupling and response time of reduced BaTiO$-3$/:Rh at wavelengths of 514 nm and 633 nm. For the as-grown, the carriers are holes for both of wavelengths of 514 nm and 633 nm. When reduced at the atmosphere of 10$+$MIN@10$/ atm oxygen partial pressure, the carrier is electron for wavelength of 514 nm, and hole for 633 nm. With higher reduction, the carriers are electrons for both of wavelengths. Two beam coupling gain is also dependent on the reduction level and incident wavelength. For the as-grown, the trap density is 23 by 10$+16$/ cm$+$MIN@3$/ for 514 nm and 15 by 10$+16$/ cm$+$MIN@3$/ for 633 nm. For the sample reduced at the atmosphere of 10$+$MIN@10$/ atm oxygen partial pressure, the trap density decreases and is 5 by 10$+16$/ cm$+$MIN@3$/ for 514 nm and 2 by 10$+16$/ cm$+$MIN@3$/ for 633 nm. With higher reduction, the trap density increases and is 12 by 10$+16$/ cm$+$MIN@3$/ for 514 nm and 5 by 10$+16$/ cm$+$MIN@3$/ for 633 nm. !9
机译:摘要:我们报道了在514 nm和633 nm波长下还原的BaTiO $ -3 $ /:Rh的两束耦合和响应时间。对于生长的情况,载体是对于514 nm和633 nm波长的孔。当在大气分压为10 ++ MIN @ 10 $ / atm的条件下还原时,载流子为波长为514 nm的电子,空穴为633 nm。随着更高的还原,载流子是两个波长的电子。两光束耦合增益还取决于衰减水平和入射波长。对于成膜的,514 nm的陷阱密度为23 x 10 $ + 16 $ / cm $ + $ MIN @ 3 $ /,633 nm为15 x 10 $ + 16 $ / cm $ + MIN @ 3 $ /纳米对于在氧分压为10 $ + MIN $ 10 $ / atm的大气中还原的样品,阱密度降低,在514 nm和2下为5×10 $ + 16 $ / cm $ + MIN @ 3 $ /。波长为633 nm时增加10 $ + 16 $ / cm $ + MIN @ 3 $ /。随着减少量的增加,阱密度增加,对于514 nm为12 x 10 $ + 16 $ / cm $ + $ MIN @ 3 $ /,对于633 nm,则为5 x 10 $ + 16 $ / cm $ + MIN @ 3 $ /。纳米!9

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