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Identification of acoustic waves in ZnO materials by Brillouin light scattering for SAW device applications

机译:布里渊光散射法在声表面波器件应用中识别ZnO材料中的声波

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摘要

Brillouin light scattering (BLS) was conducted on melt-grown ZnO bulk crystals and ZnO thin films grown by pulsed laser deposition. The bulk ZnO crystals presented both longitudinal and transverse bulk acoustic waves. Theoretical calculations agreed well with there being one piezoelectric longitudinal branch and two transverse branches. BLS measurements conducted on ZnO thin films also revealed Rayleigh surface acoustic waves (R-SAW) guided by only the surface of the layer and Sezawa modes, guided by the film thickness. Measurements were conducted for three incidence angles in order to investigate different SAW wave numbers. Higher frequency features were identified as being related to a new class of guided longitudinal (LG) SA W modes which are not usually detected for ZnO thin films. The LG-SA W modes were observed for two incidence angles (Ө=45° and 55°) corresponding to frequencies of 17.88 and 20.75 GHz, respectively. BLS measurements enable us to estimate the LG-SA W velocity as 6500 m/s. This value is three times higher than that of the currently used R-SA W. Theoretical simulations were coherent with the presence of LG modes in the ZnO layers. Such LG-SA W modes are promising for the development of novel, higher-speed SAW devices operating in the GHz-band and which could be readily incorporated in Si-based integrated circuitry.
机译:布里渊光散射(BLS)对通过脉冲激光沉积生长的熔融生长的ZnO块状晶体和ZnO薄膜进行。块状ZnO晶体呈现出纵向和横向块状声波。理论计算与一个压电纵向分支和两个横向分支非常吻合。在ZnO薄膜上进行的BLS测量还显示,瑞利表面声波(R-SAW)仅由层表面引导,而Sezawa模式则由膜厚度引导。为了研究不同的声表面波波数,对三个入射角进行了测量。较高的频率特征被确定与一类新型的引导纵向(LG)SA W模式有关,而该模式通常无法在ZnO薄膜中检测到。在分别对应于17.88和20.75 GHz频率的两个入射角(SA = 45°和55°)处观察到LG-SA W模式。 BLS测量使我们能够估计LG-SA W速度为6500 m / s。该值是当前使用的R-SA W的三倍。理论模拟与ZnO层中LG模式的存在是一致的。这种LG-SA W模式有望开发出在GHz频段工作的新型,更高速度的SAW器件,并且可以很容易地并入基于Si的集成电路中。

著录项

  • 来源
    《Oxide-based materials and devices VIII》|2017年|1010514.1-1010514.11|共11页
  • 会议地点 San Francisco(US)
  • 作者单位

    Laboratoire de Microscopie Electronique et Sciences des Materiaux, Universite des Sciences et de la Technologie d'Oran BP1505 El M'Naouer, 31100, ORAN, Algeria;

    Laboratoire de Microscopie Electronique et Sciences des Materiaux, Universite des Sciences et de la Technologie d'Oran BP1505 El M'Naouer, 31100, ORAN, Algeria;

    Laboratoire de Microscopie Electronique et Sciences des Materiaux, Universite des Sciences et de la Technologie d'Oran BP1505 El M'Naouer, 31100, ORAN, Algeria;

    Nanovation, 8 route de Chevreuse, 78117, Chateaufort, France;

    Nanovation, 8 route de Chevreuse, 78117, Chateaufort, France;

    Nanovation, 8 route de Chevreuse, 78117, Chateaufort, France;

    Nanovation, 8 route de Chevreuse, 78117, Chateaufort, France;

    Laboratoire des proprietes Mecaniques et Thermodynamiques des Materiaux, UPRCNRS9001, Universite Paris-Nord, Avenue J- B. clement, 93430 Villetaneuse, France;

    Laboratoire des proprietes Mecaniques et Thermodynamiques des Materiaux, UPRCNRS9001, Universite Paris-Nord, Avenue J- B. clement, 93430 Villetaneuse, France;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    ZnO; thin film; c-axis; Brillouin scattering; LG mode; SAW;

    机译:氧化锌;薄膜; c轴布里渊散射; LG模式锯;

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