Mapping optical process in semiconductor nanowires using dynamic optical tweezers

摘要

We present a novel method for spatial mapping of the luminescent properties of single optically trapped semiconductornanowires by combing dynamic optical tweezers with micro-photoluminescence. The technique involves the use of aspatial light modulator (SLM) to control the axial position of the trapping focus relative to the excitation source andcollection optics. When a nanowire is held in this arrangement, scanning the axial position of the trapping beam enablesdifferent sections of the nanowire axis to be probed. In this context we consider the axial resolution of the luminescencemapping and optimization of the nanowire trapping by spherical aberration correction.© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.