Abstract: The depth profile of hydrogen isotope atoms was measured by using mass spectrometry combined with resonant laser ablation. A graphite sample was implanted with deuterium by a cyclotron and was employed for the measurements. The graphite sample was ablated by a tunable laser which wavelength was corresponding to the resonant wavelength of 1S - 2S for deuterium with two- photon excitation. The ablated deuterium was ionized by a 2 $PLU 1 resonant ionization process. The ions were analyzed by a time of flight (TOF) mass spectrometer. The deuterium ions were detected very clearly with resonant ablation contrast to non-resonant measurement. The depth profile was determined from the intensity of the mass spectrum and the etching depth. The depth profile was compared to the simulated profiles. Each profile coincided within the error of the numerical simulation. !8
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机译：摘要：质谱结合共振激光烧蚀法测量了氢同位素原子的深度分布。通过回旋加速器向石墨样品中注入氘，并用于测量。用可调谐激光器烧蚀石墨样品，该可调谐激光器的波长对应于双光子激发的氘的1S-2S共振波长。烧蚀的氘通过2 $ PLU 1共振电离过程电离。通过飞行时间（TOF）质谱仪分析离子。与共振测量相比，共振消融非常清楚地检测到了氘离子。深度分布由质谱强度和蚀刻深度确定。将深度轮廓与模拟轮廓进行比较。每个轮廓都在数值模拟的误差之内。 ！8
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