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Referenced polarization imaging for surface displacement measurements

机译:参考偏振成像用于表面位移测量

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Abstract: A Referenced Polarization Imaging (RPI) method can be used to measure surface displacements in an uncontrolled environment without the use of complicated feedback and stability controls. The system is ideal for non-contact and nondestructive testing of parts or materials. Data can be acquired in a single frame, so that the effects of vibration are minimal. High resolution wavefront sensing is performed using polarization modulation instead of frequency shifting (which is necessary in a heterodyne detection system). A system for recording complex (amplitude and phase) images of coherently illuminated objects is described. The promise for this type of system is the ability to obtain digital complex images at real-time rates with simple hardware. These images can be digitally interfered on a standard PC to measure changes in the object at real-time rates. A simple RPI system is described and experimental results demonstrating performance are presented. !13
机译:摘要:参考偏振成像(RPI)方法可用于在不受控制的环境中测量表面位移,而无需使用复杂的反馈和稳定性控制。该系统非常适合零件或材料的非接触式和非破坏性测试。可以在单个帧中获取数据,因此振动的影响最小。使用偏振调制而不是频移(在外差检测系统中是必需的)执行高分辨率波前感测。描述了一种用于记录相干照明的物体的复杂(振幅和相位)图像的系统。这种系统的希望是能够使用简单的硬件以实时速率获得数字复杂图像。这些图像可以在标准PC上受到数字干扰,以实时测量物体的变化。描述了一个简单的RPI系统,并给出了演示性能的实验结果。 !13

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