THz-Raman® Characterization of Graphene and Two-Dimensional Nanomaterials

摘要

Two dimensional (2D) materials have attracted a lot of attention due to their optimal optoelectronic properties which are not found in the domain of silicon based electronic materials. The identification and characterization of 2D materials, especially differentiation of few-layer from the bulk phase, is crucial for progress in materials research and manufacturing process development. Raman spectroscopy, and more specifically low-frequency/THz-Raman~® analysis, has been recently introduced as a highly sensitive, real-time and nondestructive analytical tool for these novel materials. The low-wavenumber region which can aid the quantification of layers is usually not accessible with conventional Raman spectroscopy systems. Using volume holographic grating (VHG) based filter technology, we have developed a THz-Raman~® system that enables access to the low-frequency region with a single stage spectrometer.