首页> 外文会议>Nanostructured thin films V. >Chiral sculptured thin films as integrated dual-modality optical sensors
【24h】

Chiral sculptured thin films as integrated dual-modality optical sensors

机译:手性雕刻薄膜作为集成双模态光学传感器

获取原文
获取原文并翻译 | 示例

摘要

Chiral sculptured thin films (CSTFs) are well-suited to optical-sensing applications because their multiscale porosity and optical properties can be tailored to order. Two independent modalities of optical sensing were considered. For both modalities, the analytes to be sensed are assumed to fully penetrate the void regions of the CSTF and thereby give rise to measurable changes in the macroscopic optical responses of the CSTF. The first modality is based on the excitation of multiple surface-plasmon-polariton (SPP) waves at the planar interface of a CSTF and a metal film, while the second is based on the spectral shift in the circular Bragg phenomenon (CBP). We considered a CSTF with a central twist defect of 90sup°/sup. Our numerical studies revealed a CSTF coated with a thin layer of metal of appropriate thickness can simultaneously support the excitation of multiple SPP waves and the CBP, with both phenomenons being independently sensitive to the refractive index of a fluid which infiltrates the void regions of the CSTF. Accordingly, an integrated dual-modality optical sensor may be envisaged which harnesses both modalities of sensing simultaneously. Such an optical sensor offers the potential to detect more than one type of analyte at a time, with increased sensitivities and/or specificities.© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
机译:手性雕刻薄膜(CSTF)非常适合光学传感应用,因为它们的多尺度孔隙率和光学特性可以按需定制。考虑了两种独立的光学传感方式。对于这两种模式,假定要检测的分析物完全穿透CSTF的空隙区域,从而在CSTF的宏观光学响应中引起可测量的变化。第一种方式基于在CSTF和金属膜的平面界面处的多个表面等离子体激元(SPP)波的激发,而第二种方式则基于圆形布拉格现象(CBP)中的光谱偏移。我们考虑了中心扭曲缺陷为90 的CSTF。我们的数值研究表明,涂覆有适当厚度的金属薄层的CSTF可以同时支持多个SPP波和CBP的激发,这两种现象都对渗透到CSTF空隙区域的流体的折射率独立敏感。 。因此,可以设想集成的双模态光学传感器,其同时利用两种感测模态。这种光学传感器具有提高灵敏度和/或特异性的潜力,一次可检测一种以上的分析物。©(2012)COPYRIGHT光电仪器工程师协会(SPIE)。摘要的下载仅允许个人使用。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号