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Change of ~7Be Decay Rate in Exohedral and Endohedral C_(60) Fullerene

机译:外面和内面C_(60)富勒烯〜7Be衰变率的变化

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The half-life of exohedral ~7Be-C_(60) complex and that of ~7Be implanted in a gold foil have been found to be about the same within ≈0.2%. Using a radiochemical technique, we also measured that the probability of formation of endohedral ~7Be@C_(60) complex by nuclear implantation technique was (5.6±0.45)%. We also find that the half-life of endohedral ~7Be@C_(60) complex is shorter than that of exohedral complex by more than 1%. An analysis of these results using linear muffin-tin orbital method calculations indicates that most of the implanted ~7Be ions in fullerene C_(60) stay at a distance of ≈5.3 Angstrom from the centers of nearest C_(60) molecules forming exohedral compounds and those who enter the fullerene cages go to the centers of the cages forming endohedral ~7Be@C_(60) compounds.
机译:已发现〜7Be-C_(60)配合物的外面半衰期和植入金箔的〜7Be的半衰期在≈0.2%内大致相同。使用放射化学技术,我们还测量了通过核植入技术形成内面〜7Be @ C_(60)络合物的可能性为(5.6±0.45)%。我们还发现,内面〜7Be @ C_(60)络合物的半衰期比外表面络合物的半衰期短1%以上。使用线性松饼-锡轨道方法对这些结果进行的分析表明,富勒烯C_(60)中注入的大部分〜7Be离子与最近的C_(60)分子的中心所处的距离约为≈5.3埃,从而形成外表面化合物。那些进入富勒烯笼的人会进入笼的中心,形成内面〜7Be @ C_(60)化合物。

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