Plasma imaging in the XUV wavelength range (175 A) using curved layered-synthetic-microstructure coated surfaces

摘要

Abstract: A recently constructed calibration facility utilizing a Manson soft x-ray line source in the wavelength range of 8 - 114 angstroms and a Penning ionization discharge (PID) in the 100 - 350 angstroms range, has been used to map the reflectivity across a curved layered synthetic microstructure (LSM) coated surface. This calibrated mirror was also used to image the Al III emission ($lambda $EQ 170 - 175 angstroms) from the PID. !10