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Parabasal thin element approximation for the analysis of the diffractive optical elements

机译:准基底薄元素近似,用于衍射光学元件的分析

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The thin element approximation is an efficient algorithm to analyze diffractive optical elements (DOEs), whose feature size is large enough compared with the working wavelength. However, the thin element approximation is only valid under the condition of normal illumination. We hereby extend an algorithm, which is called the parabasal thin element approximation, to include the non-perpendicular illumination. More specifically, the thin element approximation is valid for paraxial incident beam, while the parabasal thin element approximation is valid for parabasal beam*. In this article, we present the algorithm of the parabasal thin element approximation and compare the result with that of rigorous method. All the simulations are based on field tracing and done with the optical software VirtualLab™.
机译:薄元素近似是一种分析衍射光学元件(DOE)的有效算法,其特征尺寸与工作波长相比足够大。但是,薄元素近似仅在正常照明条件下有效。我们在此扩展一种算法,称为旁基底薄元素近似,以包括非垂直照明。更具体地,薄元素近似对于近轴入射光束有效,而准基底薄元素近似对于准基底光束*有效。在本文中,我们介绍了准基础薄层单元近似算法,并将结果与​​严格方法进行了比较。所有模拟均基于现场跟踪,并使用光学软件VirtualLab™完成。

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