High Spatial Resolution X-ray Spectra of Mg, Al, Si and P L-Emission Observed with a Newly Developed Soft X-ray Spectrometer for EPMA

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• 来源
  《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》|2012年|776-777|共2页
• 会议地点 Phoenix, AZ(US)
• 作者

  T. Murano; H. Takahashi; N. Handa; M. Terauchi; M. Koike; T. Kawachi; T. Imazono; N. Hasegawa; M. Koeda; T. Nagano; H. Sasai; Y. Oue; Z. Yonezawa; S. Kuramoto;

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• 作者单位

  JEOL Ltd. 1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan;

  Institute for Multidisciplinary Research for Advanced Materials Tohoku University Sendai 980-8577 Japan;

  Japan Atomic Energy Agency 8-1 Umemidai Kizu 619-0215 Japan;

  Customer & Optical Products Department Shimadzu Corp. 1 Nishinokyo-Kuwabaracho Nakagyo-ku Kyoto 604-8511 Japan;

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• 入库时间 2022-08-26 14:38:38