Recording low spatial frequencies while maintaining information limit resolution using the TEAM I microscope

著录项

• 来源
  《Microscopy and microanalysis.;Microscopy and microanalysis.》|2010年|p.524-525|共2页
• 会议地点 Portland OR(US)
• 作者

  S.J Haigh; B. Jiang; D. Alloyeau; C. Kisielowski; A.I.Kirkland;

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• 作者单位

  Department of Materials, University of Oxford, Parks Rd., Oxford, OX1 3PH, UK;

  FEI Company, NE Dawson Creek Dr., Hillsboro Oregon, 97124;

  National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, One Cyclotron Rd., Berkeley CA 94720;

  National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, One Cyclotron Rd., Berkeley CA 94720;

  Department of Materials, University of Oxford, Parks Rd., Oxford, OX1 3PH, UK;

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• 会议组织
• 原文格式 PDF
• 正文语种 eng
• 中图分类 显微镜;
• 关键词