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Transformer Terminal-Duality Model for Windings Tum-to-Tum Faults Simulation

机译:变压器终端 - 二元模型用于绕组Tum-Tum缺陷仿真

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Turn-to-turn fault (TTF) inception on a transformer can be very destructive and damaging. In order to check the performance of TTF protection algorithms, it is necessary to model the transformer in the presence of TTFs. Under minor TTF inception, the rise in the terminal currents of the transformer is just in the order of its no-load current. Therefore, in this study, a suitable transformer model should be employed to address the role of core and windings under the occurrence of minor TTF, accurately. This paper presents a new equivalent reluctance circuit for three-phase transformers in the presence of TTFs. This equivalent model employs the parameters determined by the finite element method. This model contains the admittance matrix and it is well-known as the terminal-duality model. For verification of the model, a real three-phase custom-built transformer is employed and modeled in this paper. The results obtained from the developed model are validated against the experimental results of TTF tests carried out on this transformer.
机译:变压器上的转弯断层(TTF)成立可能是非常破坏性和损坏的。为了检查TTF保护算法的性能,有必要在TTF的存在下模拟变压器。在较小的TTF成立下,变压器的终端电流的升高恰好是其无负载电流的顺序。因此,在本研究中,应采用合适的变压器模型来解决核心和绕组在次要TTF的发生下的作用,准确。本文在TTFS存在下为三相变压器提供了一种新的等效磁阻电路。该等效模型采用由有限元方法确定的参数。该模型包含导纳矩阵,它是众所周知的终端 - 二元模型。为了验证模型,本文采用了一个真正的三相定制变压器和建模。从开发模型获得的结果验证了在该变压器上进行的TTF测试的实验结果。

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