Test Time and Area Optimized BrST Scheme for Automotive ICs

摘要

As cars become increasingly computerized and their safety functions are evolving rapidly, the number of complex safety-critical components deployed in advanced driver assistance systems or autonomous vehicles is progressively rising with high-end models containing more than a hundred embedded microcontrollers. These integrated circuits must adhere to stringent requirements for high quality and long-term reliability driven by functional safety standards. This requires test solutions that address challenges posed by automotive electronics. The paper presents a scan-based LBIST scheme optimizing test time and area overhead during in-system test applications for automotive ICs. It ensures highly reliable operations of ICs for the duration of their lifespan. The proposed scheme works with observation test points that capture faulty effects every shift cycle into separate observation scan chains. To reduce area overhead, the scheme takes advantage of a procedure allowing one to share flip-flops among control points. It is also shown how test points can enhance test coverage in the presence of cascaded clock gaters. Finally, processing challenges when fault simulating every scan shift cycle to determine observed faults are addressed. Experimental results obtained for contemporary automotive designs and reported herein show significant improvements in quality of test over traditional BIST schemes.